Machine Vision Recognition for Quality Inspection_Vision Potential_EL testing-PL testing-PV station inspection

The Portable Daylight EL Inspection Instrument adopts an InGaAs (Indium Gallium Arsenide) sensor and is integrated with patented filtering and phase-locking technology.

VISION POTENTIAL PV UAV-based Daylight EL Inspection Instrument is dedicated to the EL internal defect quality inspection of PV array modules in solar power plants.

The Portable Daylight EL Tester adopts an InGaAs (Indium Gallium Arsenide) sensor and is integrated with patented filtering and phase-locking technology.

VISION POTENTIAL PV UAV-based EL Inspection Instrument (Model: SC-EL-Drone) is dedicated to the EL internal defect quality inspection of PV array modules in solar power plants.

Vision Potential Portable IV Tester supports a maximum voltage measurement range of 1500V and a maximum current measurement range of 20A, making it capable of testing photovoltaic modules with a power rating of up to 30kW.

Vision Potential Perovskite PL&EL Tester is mainly applied to Raw material quality control and Analyze the crystal structure and impurity distribution of core raw materials via PL testing to eliminate defects from the source;

SC-EPL EPL Testing Module is an integrated all-in-one testing device that combines dual technologies of EL (Electroluminescence Testing) and PL (Photoluminescence Testing). It can simultaneously realize intrinsic defect detection of materials/devices under non-electrified conditions and electrical performance defect detection under electrified conditions. Its application covers the entire life cycle of photovoltaic products, and is applicable to multiple core fields including university laboratories, industrial manufacturing, and enterprise R&D testing.

Microcrack detection module developed by Vision Potential can be integrated into the loading sections of texturing lines, etching lines, as well as various types of wafer sorters.

The as-cut silicon wafer SPL (Photoluminescence) testing equipment developed by Shichuang Intelligence is a professional device that conducts silicon wafer quality inspection based on the photoluminescence principle of silicon materials.